[PDF.03ta] Noncontact Atomic Force Microscopy (NanoScience and Technology)

Noncontact Atomic Force Microscopy (NanoScience and Technology)

[PDF.wp98] Noncontact Atomic Force Microscopy (NanoScience and Technology)

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 |  Springer |  2012-10-23 |  2002-07-24 | Original language:English | PDF # 1 |  9.25 x1.08 x6.10l,.0 | File type: PDF | 440 pages

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|| ||"This book gives a comprehensive overview of the state-of-the-art of this dynamic force microscopy technique in 20 chapters, each written by experts in the field. It covers the theoretical basis, as well as applications to semiconducting surfaces, ionic cryst

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mec...

You easily download any file type for your gadget.Noncontact Atomic Force Microscopy (NanoScience and Technology)   |  From Brand: Springer. Which are the reasons I like to read books. Great story by a great author.

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