[PDF.00rz] Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-Effect Transistors

Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-Effect Transistors

[PDF.cr06] Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-Effect Transistors

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 | #16225330 in Books |  2008-02-21 | Original language:English | PDF # 1 |  9.44 x.33 x6.69l,.48 | File type: PDF | 144 pages

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||About the Author|Dipl.-Ing. Dr.techn.: Electrical Engineering and PhD studies at the Vienna University of Technology. IC design engineer at NXP Semiconductors in Gratkorn, Austria.

Semiconductor process and device simulators are well established tools for the reduction of the development time for semiconductor devices. Nowadays simulation efforts go beyond solving the basic semiconductor device equations. Especially the modeling and simulation of aging processes has tremendously gained in importance. This book gives insight into the topic of semiconductor device simulation and focuses on the modeling of degradation mechanisms. Negative bias temper...

You easily download any file type for your device.Modeling and Simulation of Negative Bias Temperature Instability: Degradation of Field-Effect Transistors   |  Dr. Robert Entner. I was recommended this book by a dear friend of mine.

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