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Thin Film Analysis by X-Ray Scattering
Mario Birkholz
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| #3276171 in Books | 2005-12-23 | Original language:English | PDF # 1 | 9.55 x1.18 x6.97l,.0 | File type: PDF | 378 pages||4 of 4 people found the following review helpful.| Great book for thin film XRD|By Ying Shi|Because of the time limitation, I only read Chapter 6 for residual stress analysis, it was hard to follow at the beginning. After reading other reference papers and having better understanding about the theory, I read it again, I found the whole chapter was so well organized and I extremely like "complexity of ladder" structure, it is a||"... this book should prove very useful to anyone..."| Material Characterization ||From the Back Cover|While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science i
With contributions by Paul F. Fewster and Christoph Genzel
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and the...
You can specify the type of files you want, for your device.Thin Film Analysis by X-Ray Scattering | Mario Birkholz.Not only was the story interesting, engaging and relatable, it also teaches lessons.
