[PDF.94gv] Scanning Microscopy for Nanotechnology: Techniques and Applications
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Scanning Microscopy for Nanotechnology: Techniques and Applications
From Weilie Zhou
[PDF.zt24] Scanning Microscopy for Nanotechnology: Techniques and Applications
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| #2571932 in Books | Weilie Zhou | 2006-11-27 | Original language:English | PDF # 1 | 9.21 x1.19 x6.14l,2.31 | File type: PDF | 522 pages | Scanning Microscopy for Nanotechnology Techniques and Applications||From the Back Cover||Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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