[PDF.67yl] Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

[PDF.ru84] Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

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 | #12500379 in Books |  2011-09-26 |  2013-10-04 | Original language:English | PDF # 1 |  9.25 x.57 x6.10l,.79 | File type: PDF | 232 pages

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It is true that the Metal-Oxide-Semiconductor Field-Eeffect Transistor (MOSFET) is a key component in modern microelectronics. It is also true that there is a lack of comprehensive books on MOSFET characterization in gen­ eral. However there is more than that as to the motivation and reasons behind writing this book. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements which made the task of MOSFET charac...

You can specify the type of files you want, for your device.Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)   |  From Springer.Not only was the story interesting, engaging and relatable, it also teaches lessons.

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